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As use of lasers, photo-detectors, and PC's has spread, these technologies have been used more and more in combination with optical microscopes,
especially inverted microscopes. The Nikon Inverted Microscope TE2000 responds to this market demand by utilizing a special "stratum structure" to
allow the use of multiple modules at once without altering its configuration.
Here we will introduce examples of such upgraded systems with the Inverted Microscope TE2000.
Differential interference contrast microscopy transforms minute differences in refraction indexes of light passing through an unstained
specimen, or optical path differences from the specimen surface shape, into a monochromatic shadow-cast images enabling observation.
Nikon uses short-shear prisms with VEC (Video Enhanced Contrast) to enable viewing and recording of extremely fine structures.