Enhanced observation, durability and operational performance, combined with improved functionality between the microscope and digital cameras provide ideal imaging
Enhanced observational performance
Epi-fluorescence observation widens inspection range (L300N/L300ND/L200ND only)
- The L300N/L300ND/L200ND is capable of Diascopic illumination and provides various observation methods such as brightfield, darkfield, simple polarizing and DIC. It also employs Epi-fluorescence observation, including 365 nm UV excitation.
- Highly beneficial in inspection of semiconductor resist residues and organic electroluminescence displays
Objective lens: CFI60-2 TU Plan Fluor 10x
Motorized mercury fiber illuminator Intensilight for Epi-fluorescence observation (L300N/L300ND/L200ND only)
Four times brighter than conventional Diascopic observation (L300ND only)
- The L300ND employs a new light source and advanced optics to provide four times brighter illumination for Diascopic observation.
CFI60-2 optics offer long working distance and high NA
- Nikon's original CFI60-2 optics offer both image brightness through high NA and wider sample range and access with long WD.
- Provides clear, high-contrast brightfield images by minimizing flare.
- The "fly-eye" lens array, which provides uniform illumination throughout the visual field, is employed for darkfield illumination optics, allowing remarkably bright, high-resolution darkfield images.
Enhanced environmental consideration and operation
High-intensity 12V-50W halogen illuminator is brighter than that of a standard 12V-100W illuminator
The motorized universal nosepiece is three times more durable than conventional models
Antistatic coatings for stronger safeguards against contamination
- Antistatic coatings have been applied to the body, stage, eyepiece tube and other various controls. These coatings strengthen safeguards against contamination and help prevent damage to samples caused by electrostatic charges, thus contributing to higher yields.
Tilting trinocular eyepiece tube for observation at optimum eyepoint level
Fixed-position X-Y fine movement control
Target for easier focusing
Controls located at microscope front
Improved functionality between the microscope and digital cameras
Optimized workflow observation, image capture and analysis